Ronchigram

Ronchigram (after Italian physicist Vasco Ronchi [ˈroŋki][1][2]) is the convergent beam diffraction pattern[3] of a known object with features comparable to the diffracting wavelength. In the case of electron Ronchigrams amorphous materials are used. The structure of the Ronchigram encodes information about the aberration phase field across the objective aperture.[4] As such, Ronchigrams have become increasingly important with the invention of aberration corrected scanning transmission electron microscopy.[5]

References

  1. ^ Ronchi, Vasco (1964-04-01). "Forty Years of History of a Grating Interferometer". Applied Optics. 3 (4): 437–451. doi:10.1364/AO.3.000437. ISSN 2155-3165.
  2. ^ Ronchi, Vasco (1923-07-01). "Due nuovi metodi per lo studio delle superficie e dei sistemi ottici". Il Nuovo Cimento (1911-1923) (in Italian). 26 (1): 69–71. doi:10.1007/BF02959347. ISSN 1827-6121. S2CID 122620904.
  3. ^ Kossel, W.; Möllenstedt, G. (1939). "Elektroneninterferenzen im konvergenten Bündel". Annalen der Physik (in German). 428 (2). Wiley: 113–140. doi:10.1002/andp.19394280204. ISSN 0003-3804.
  4. ^ Kirkland, Earl J. (2010). Advanced Computing in Electron Microscopy. Boston, MA: Springer US. doi:10.1007/978-1-4419-6533-2. ISBN 978-1-4419-6532-5. S2CID 62171402.
  5. ^ Schnitzer, N.; Sung, S.H.; Hovden, R.H. (2019). "Introduction to the Ronchigram and its Calculation with Ronchigram". Microscopy Today. 3 (3): 12–15. doi:10.1017/S1551929519000427. S2CID 155224415.


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